1st Annual Basic Course in Reflectance Confocal Microscopy: Non-Invasive Diagnosis of Skin Cancer

1st Annual Basic Course in Reflectance Confocal Microscopy: Non-Invasive Diagnosis of Skin Cancer is organized by Memorial Sloan Kettering Cancer Center (MSKCC) and will be held on Oct 07, 2018 at Mortimer B. Zuckerman Research Center, New York City, New York, United States of America.

The target audience for this medical event is Dermatologists, Dermatopathologists, Surgical Oncologists, Surgical Pathologists, Technologists, Medical Physicist, Industry, Residents, Fellows, Medical Students, and Research Fellows. This CME Conference has been approved for a maximum of 8 AMA PRA Category 1 Credits.

Overview:
Reflectance confocal microscopy (RCM) is a non-invasive device that images skin lesions at high resolution in vivo similar to traditional pathology. This one day course will help attendees develop familiarity with the basic principles and terminology of RCM. The attendees will learn how to differentiate routinely encountered benign cutaneous neoplasm from malignant neoplasm and integrate RCM in their routine clinical workflow. This will be an interactive course with lecture style teaching supplemented by hands-on training on the confocal microscope.

Objectives:
• Learn the basic principles of reflectance confocal microscopy
• Learn the terminology for reflectance confocal microscopy
• Learn to integrate reflectance confocal microscopy in routine clinical practice
• Learn to acquire and interpret reflectance confocal microscopy at the bedside

Additional details will be posted as soon as they are available.