Ondrej Krivanek was born in Prague, Czech Republic, and he obtained his B.Sc. and Ph.D. in Physics in the UK, from the Universities of Leeds and Cambridge, respectively. He worked as a post-doc at Kyoto University, Bell Labs and UC Berkeley, and then as professor of physics at Arizona State University (ASU), Director of Research at Gatan, and visiting scholar at U. of Cambridge. In 1997, he co-founded Nion Co. and has since been Nion’s President, as well as Affiliate Professor at ASU.
At the beginning of his career, Ondrej pioneered imaging semiconductor devices by high resolution electron microscopy, and he obtained the first lattice resolution images of the iconic Si-SiO2 interface in MOSFETs. He then developed (and later co-developed) a number of instruments for electron microscopy and spectroscopy, such as electron energy loss spectrometers and imaging filters, CCD cameras, and imaging and spectroscopy software.
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