Masashi Nojima PhD

Dr. Masashi Nojima, Ph.D.-engineering, now is a Junior Associate Professor of Engineering, Research Institute of Science and Technology, Tokyo University of Science. He completed his doctorate in microbeam analysis in 2003. He has invented shave-off depth profiling by utilizing FIB micro-machining and SIMS. He applied the shave-off depth profiling for failure analysis of nano-devices: electro-chemical-migration phenomena in 2005-2008. In 2012, he has developed an Ar gas cluster ion beam (GCIB) dynamic SIMS system for polymer depth profiling and imaging.